Abstract

ALFONSO, J. A; LAVELLE, B; GREAVES, E.D  and  SAJO-BOHUS, L. DESARROLLO DE UN MÉTODO PARA LA DETERMINACIÓN DE ESFUERZOS RESIDUALES EN PELÍCULAS UTILIZANDO DIFRACCIÓN DE RAYOS-X DISPERSIVO EN ENERGÍA.. Rev. LatinAm. Met. Mat. [online]. 2002, vol.22, n.2, pp.18-23. ISSN 0255-6952.

A simple and easy of reproducing procedure that allows fine coatings and films residual stress determination using energy dispersive x-ray diffraction is shown. The system consists of a conventional x-ray generator, a texture goniometer and a high-resolution solid state HP Ge detector connected to an x-ray spectrometer. The residual stress in a magnetron sputtered Ni film on polycrystalline graphite is determined using this approach.