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Revista Latinoamericana de Metalurgia y Materiales
Print version ISSN 0255-6952
Abstract
MARTINEZ, Héctor M.; TORRES, Jaime; LOPEZ-CARRENO, Luis D. and RODRIGUEZ-GARCIA, Mario E.. EFFECT OF CERIO INSERTION ON THE STRUCTURAL, ELECTROCHEMICAL AND OPTICAL PROPERTIES OF MoO3 THIN FILMS . Rev. LatinAm. Metal. Mater. [online]. 2014, vol.34, n.1, pp.101-106. ISSN 0255-6952.
Cerium-doped MoO3 thin films were grown through spray pyrolysis using (NH4)6Mo7O24.4H2O 0.1 M solution. The doping was performed by adding 0.1M CeCl3.7H2O, in a ratio of 2% by volume. X-ray and Auger electron spectra show of Ce incorporation in MoO3 thin film. X-ray diffraction showed that Cerium insertion destroys the α-MoO3 structure observed in undoped films. The electrochemical properties were studied using the cyclic voltammetry technique with -400 to 400 mV and scanning speeds from 16 to 144 mV/s. It was established that the diffusion coefficient varies from 1.06 x 10-10 cm2/s for the undoped film to 3.49 x 10-10 cm2/s for doped film. This suggests that the doped film favors ion exchange processes. The optical transmittance in the range of 290-2500 nm showed that the light transmission of the film doped with Cerium is higher by 10% compared to the undoped film.
Keywords : MoO3; Cíclic Voltammetry; nanostructured..